作者机构:
[Xu, Shoulong; Zou, Shuliang] Univ South China, Sch Environm & Safety Engn, Hengyang 421001, Peoples R China.;[Xu, Shoulong] Tsinghua Univ, Dept Engn Phys, Beijing 100084, Peoples R China.;[Han, Yongchao; Qu, Yantao] China Inst Atom Energy, Beijing 102413, Peoples R China.
通讯机构:
[Zou, Shuliang] U;Univ South China, Sch Environm & Safety Engn, Hengyang 421001, Peoples R China.
关键词:
active pixel sensor;video monitor;radiation detector;radiation damage;radiation response;nuclear accident
摘要:
In this paper, we present the availability of an active pixel sensor (APS) with four transistors (4T) as a video monitor and radiation detector. Analyzing radiation damage must be one of the first steps in recovering from nuclear accidents, and the radiation response characteristic is the basis for the use of 4T-APS to detect radiation. The goal of this work is to suggest the use of cameras with 4T-APS in widely distributed irradiation detectors. The total ionizing dose (TID) of radiation damage on 4T-APS provided a threshold. Radiation tolerance was improved with the help of a radiation shielding structure. The radiation response showed integration time dependence and pixel information dependence, and greater radiation response was observed from the pixels with lower grayscale values. Two methods are suggested based on different monitoring scenes. This study can help to greatly improve nuclear accident emergency response and the safety of nuclear facilities.
作者机构:
[Yongxia Liu; Shuliang Zou; Ruirui Tang] School of Mechanical Engineering,University of South China;[Yongxia Liu; Shuliang Zou; Ruirui Tang] Hunan Key Laboratory of Nuclear Facilities Emergency Safety Technology and Equipment
会议名称:
2018 International Conference on Mechanical,Electrical,Electronic Engineering & Science(MEEES 2018)
会议时间:
2018-05-26
会议地点:
中国重庆
摘要:
In the development of anti-radiation excavator, the structure-design of lead glass windows is a key problem needs to solve. By conducting the irradiation and sun exposure experiment of ZF6 and ZF506 l
通讯机构:
[Xiao, Weiwei] U;[Deng, Hua] C;Univ South China, Sch Mech Engn, Hengyang 421001, Hunan, Peoples R China.;CNNC Jianzhong Nucl Fuel Co, Yibin 644000, Sichuan, Peoples R China.
关键词:
Accident-tolerant fuel;Adhesion strength;Roughness of substrate;Sputtered TiN coating;Sputtering power
摘要:
TiN coatings have been deposited on Zr-4 substrates using direct current (DC) magnetron sputtering and the effects of roughness of substrate and sputtering power on the microstructure, thickness/deposition rate, adhesion properties and residual stress of coatings have been studied. The microstructures of the coatings were characterized by using scanning electron microscope (SEM) and X-ray diffractometer (XRD). The thicknesses of the coatings were detected by using SEM. The adhesion property was tested by using scratch testing. The residual stress was measured by using the XRD method. The results shown that the microstructure, thickness/deposition rate, adhesion properties and residual stress of coating are significantly influenced by the roughness of substrate and sputtering power. The roughness of substrate has significant influence on the surface micrograph of the coating but not obvious on the thickness/deposition rate. The microstructure, thickness/deposition rate is remarkably affected by the sputtering power. In addition, the adhesion property does not vary monotonically with the roughness of substrate and the sputtering power. The adhesion strength presents a trend of first rises and then declines with the increase of surface roughness of substrate and sputtering power. The residual stresses of the coating were compressive and the residual stress magnitude of the coatings deposited by relatively low sputtering power was higher than that deposited by relatively high sputtering power. (C) 2018 Elsevier B.V. All rights reserved.
作者机构:
[徐守龙; 邹树梁; 郭赞; 匡雅] School of Environmental and Safety Engineering, University of South China, Hengyang;421001, China;[黄有骏] Nuclear Power Institute of China, Chengdu;610200, China;[徐守龙; 邹树梁; 郭赞; 匡雅] 421001, China
通讯机构:
[Zou, S.-L.] S;School of Environmental and Safety Engineering, University of South China, Hengyang, China
通讯机构:
Hunan Provincial Key Laboratory of Emergency Safety Technology and Equipment for Nuclear Facilities, University of South China, Hengyang, Hunan, China
作者机构:
[徐守龙; 邹树梁] Hunan Provincial Key Laboratory of Emergency Safety Technology and Equipment for Nuclear Facilities, University of South China, Hengyang, 421001, China;[黄有骏] Nuclear Power Institute of China, Chengdu, 610213, China;[徐守龙] College of Nuclear Science and Technology, University of South China, Hengyang, 421001, China
通讯机构:
[Zou, S.-L.] H;Hunan Provincial Key Laboratory of Emergency Safety Technology and Equipment for Nuclear Facilities, University of South China, Hengyang, China
关键词:
γ射线, 总剂量效应, 电离效应, active pixel sensor, CMOS APS, γ-ray, total ionizing dose effect, ionizing radiation effect
摘要:
研究了γ射线电离辐射效应对商用CMOS有源像素传感器(APS)性能参数的影响, 着重分析了量子效率、转换增益、暗电流、坏点和脉冲颗粒噪声等参数。研究结果表明: 当受到1 000 Gy辐射后, APS失去工作能力, 无信号输出或像素灰度值仅为0, 110, 255 DN。60Co γ射线的离位截面约为10-25 cm2(0.1 b)。当剂量率低于58.3 Gy/h且辐照时间较短时, 辐射对量子效率及转换增益无影响, 坏点产生数为0, 总剂量效应使3T-APS的本底噪声升高到4.62 DN但对4T PPD APS几乎无影响。脉冲颗粒噪声引起的各灰度值像素数量分布呈泊松分布, 并与剂量率正相关。 The effect of γ-ray irradiation on the performance parameters of commercial off the shelf CMOS active pixel sensors was studied, specially focusing on the analysis of quantum efficiency, conversion gain, dark current, dead pixels, and pulse parameters such as particle noise pixels. As result shown, the active pixel sensors incapacitated after 1 000 Gy γ-ray irradiation present as no signal output or pixel gray value of only 0, 110 or 255 DN. The displacement cross section of cobalt-60 of γ-ray is about 10-25 cm2(0.1 b). After short time and low dose rate irradiation below 58.3 Gy/h, the irradiation has less effect on the quantum efficiency and conversion gain, the number of dead pixels is still zero, and the background noise of 3T APS rise up to 4.62 DN but less effect on 4T-APS. The frequency of the gray value of the dark image caused by the pulse noise is in Poisson distribution and correlated with γ-ray radiation dose rate.
作者机构:
[朱志超; 宋英明; 梁烨; 叶凯萱; 邹树梁; 颜佳伟; 张震宇; 张秋楠] School of Nuclear Science and Technology, University of South China, Hengyang, 421001, China;[王宁] Center of Information, Nuclear Power Institute of China, Chengdu, 610213, China
关键词:
核设施退役;辐射场重构;拆除路径优化;功能软件
摘要:
辐射场分布和路径选择是核设施退役过程中影响工作人员吸收剂量的主要因素。针对核设施退役过程中多源项的三维辐射场,采用点核积分的方法进行重构,重构结果与蒙特卡罗程序计算结果吻合很好,验证了点核积分法的可行性。将核退役拆除路径问题抽象为一种类旅行商问题数学模型,构造不同拆除路径下所受外照射剂量对应的剂量矩阵,根据辐射防护ALARA (As Low As Reasonably Achievable)原则,利用遗传算法进行寻优。对于多源项退役拆除实例,计算给出了最优化拆除路径和三维可视化显示,并对优化效果进行了讨论。设计开发了面向核设施退役过程的辐射场重构与拆除路径优化功能软件。
摘要:
W-Ni-Fe-Hf series alloy with different Hf contents were prepared through liquid phase sintering. Influences of Hf on mechanical properties, shielding effect and microstructure of W-Ni-Fe-Hf alloy are analyzed and discussed by using SEM, XRD device, metalloscope, BH1326 gamma-ray shield tester and so on. The results of the study show that adding the microelement Hf could increase dispersity of powder effectively. Hf distributes in the binding phase ofW-Ni-Fe-Hf series alloy (percentage) as an intermediate phase. This intermediate phase not only could refine crystals, but also has good affinity to the microelement Hf, thus enabling to improve mechanical properties and shielding effect of the alloy. However, the intermediate phase formed by excessive Hf is easy to cause segregation on the interface between W crystal boundaries and Ni-Fe binding phase, which would weaken interface binding strength and thereby deteriorate mechanical properties of the alloy. (C) 2017 Elsevier B.V. All rights reserved.