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Predicting propagation lifetime of embedded cracks using industrial computed tomography

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成果类型:
期刊论文
作者:
Li, Linsheng;Zeng, Li*;Wan, Taoyu;Liu, Baodong
通讯作者:
Zeng, Li
作者机构:
[Li, Linsheng; Zeng, Li; Liu, Baodong] Chongqing Univ, Key Lab Optoelect Technol & Syst, ICT Res Ctr, Educ Minist China, Chongqing 400044, Peoples R China.
[Li, Linsheng] Univ S China, Sch Mech Engn, Hengyang 421001, Peoples R China.
[Wan, Taoyu] Nanjing Univ Informat Sci & Technol, Coll Math & Phys, Nanjing 210044, Peoples R China.
[Zeng, Li] Chongqing Univ, Coll Math & Stat, Chongqing 400044, Peoples R China.
通讯机构:
[Zeng, Li] C
Chongqing Univ, Key Lab Optoelect Technol & Syst, ICT Res Ctr, Educ Minist China, Chongqing 400044, Peoples R China.
语种:
英文
关键词:
Computed tomography (CT);Crack propagation;Ellipse fitting;Embedded crack;Stress intensity factor
期刊:
Advanced Science Letters
ISSN:
1936-6612
年:
2011
卷:
4
期:
4-5
页码:
1889-1894
基金类别:
National Natural Science Foundation of ChinaNational Natural Science Foundation of China (NSFC) [60972104]
机构署名:
本校为其他机构
院系归属:
机械工程学院
摘要:
The propagation lifetime of surface cracks can be forecasted by the Paris method. Due to the difficulty of crack detection and the complexity of crack propagation, it is difficult to forecast the propagation lifetime of actual embedded cracks. Here we present a methodology for forecasting crack propagation, whereby the workpiece containing the embedded crack is firstly scanned by industrial computed tomography (CT) to obtain its CT images, extracting crack edges with the Canny operator. Secondly, in order to fit crack boundaries that have a lar...

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