版权说明 操作指南
首页 > 成果 > 详情

Microstructural parameters estimation for sputtered Al coating via SEM, EDS, X-ray diffraction line broadening and EBSD

认领
导出
Link by DOI
反馈
分享
QQ微信 微博
成果类型:
期刊论文
作者:
Yang, Chen;Xiao, Weiwei;Huang, Jinghao;Liu, Shihong;Zou, Shuliang
通讯作者:
Weiwei Xiao
作者机构:
[Liu, Shihong; Yang, Chen; Huang, Jinghao; Xiao, Weiwei; Zou, Shuliang] Univ South China, Sch Mech Engn, Hengyang 421001, Hunan, Peoples R China.
[Liu, Shihong; Yang, Chen; Huang, Jinghao; Xiao, Weiwei; Zou, Shuliang] Univ South China, Hunan Prov Key Lab Emergency Safety Technol & Equi, Hengyang 421001, Hunan, Peoples R China.
通讯机构:
[Weiwei Xiao] S
School of Mechanical Engineering, University of South China, Hengyang, Hunan, 421001, China<&wdkj&>Hunan Provincial Key Laboratory of Emergency Safety Technology and Equipment for Nuclear Facilities, University of South China, Hengyang, Hunan, 421001, China
语种:
英文
关键词:
X-ray diffraction line broadening;EBSD;W -H plot;Microstructural parameter;As -deposited Al coating
期刊:
Vacuum
ISSN:
0042-207X
年:
2022
卷:
206
页码:
111496
基金类别:
Natural Science Foundation of Hunan Province of China; Scientific Research Project of Hunan Provincial Education Department; [2020JJ5467]; [19B492]
机构署名:
本校为第一机构
院系归属:
机械工程学院
摘要:
Aluminum (Al) coatings were deposited on Zr-4 alloy substrate by magnetron sputtering. The microstructure parameters of the as-deposited coating were characterized by means of scanning electron microscope (SEM), energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and electron backscattered scattering detection (EBSD). The results showed that: via the SEM and EDS, it can be found that Al atoms and Zr atoms undergo rapid interdiffusion at the interface, forming an Al-Zr diffusion layer with a thickness of about 1.5 mu m; via X-ray diffraction line broadening, the estimated crystal size...

反馈

验证码:
看不清楚,换一个
确定
取消

成果认领

标题:
用户 作者 通讯作者
请选择
请选择
确定
取消

提示

该栏目需要登录且有访问权限才可以访问

如果您有访问权限,请直接 登录访问

如果您没有访问权限,请联系管理员申请开通

管理员联系邮箱:yun@hnwdkj.com