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Single event effect evaluation of different communication ways based on 40nm SRAM-FPGA

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成果类型:
期刊论文
作者:
Zhao, Xu;Du, Xuecheng;Xiong, Xu;Chen, Zhi;Jiang, Wei
通讯作者:
Du, Xuecheng(duxuecheng@usc.edu.cn)
作者机构:
[Zhao, Xu; Du, Xuecheng; Xiong, Xu] School of Nuclear Science and Technology, University of South China, Hengyang City
421001, China
[Chen, Zhi; Jiang, Wei] Science and Technology on Reactor System Design Technology Laboratory, Nuclear Power Institute of China, Chengdu
610213, China
[Zhao, Xu; Du, Xuecheng; Xiong, Xu] 421001, China
语种:
英文
期刊:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN:
0277-786X
年:
2023
卷:
12610
页码:
146
机构署名:
本校为第一机构
院系归属:
核科学技术学院
摘要:
Field-programmable gate array (FPGA) is now considered by an increasing number of designers in various fields of application, such as space and aircraft embedded control systems, image and signal processing. It is a popular way to design different serial communication protocols including serial and network communications implemented by FPGA, which ensure data transfer accuracy and timing. However, single event effects (SEE) can pose a serious threat to the reliability of FPGA in the radiation environments. In order to evaluate the reliability a...

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