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Extraction of Chromatographic Characteristics Based on Wavelet Ridge and Morphology

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成果类型:
会议论文
作者:
Lin, Xiaoming*;Liang, Tianzhi;Cao, Liang
通讯作者:
Lin, Xiaoming
作者机构:
[Lin, Xiaoming] Guangdong Shunde Innovat Design Inst, Guangdong Shunde Ind Design Res Inst, Foshan, Peoples R China.
[Liang, Tianzhi] Guangdong Univ Technol, Sch Automat, Guangzhou, Guangdong, Peoples R China.
[Cao, Liang] Univ South China, Sch Elect Engn, Hengyang, Peoples R China.
通讯机构:
[Lin, Xiaoming] G
Guangdong Shunde Innovat Design Inst, Guangdong Shunde Ind Design Res Inst, Foshan, Peoples R China.
语种:
英文
关键词:
Chrossmatographic characteristics;wavelet ridge;morphology;Gaussian fitting;overlapping peak
期刊:
2019 4TH IEEE INTERNATIONAL CONFERENCE ON BIG DATA ANALYTICS (ICBDA 2019)
年:
2019
页码:
297-302
会议名称:
4th IEEE International Conference on Big Data Analytics (ICBDA)
会议时间:
MAR 15-18, 2019
会议地点:
Suzhou, PEOPLES R CHINA
会议主办单位:
[Lin, Xiaoming] Guangdong Shunde Innovat Design Inst, Guangdong Shunde Ind Design Res Inst, Foshan, Peoples R China.^[Liang, Tianzhi] Guangdong Univ Technol, Sch Automat, Guangzhou, Guangdong, Peoples R China.^[Cao, Liang] Univ South China, Sch Elect Engn, Hengyang, Peoples R China.
会议赞助商:
IEEE, Xian Jiaotong Liverpool Univ, Res Inst Big Data Analyt, Univ Texas Dallas, Hong Kong Polytechn Univ
出版地:
345 E 47TH ST, NEW YORK, NY 10017 USA
出版者:
IEEE
ISBN:
978-1-7281-1282-4
基金类别:
Science and Technology Innovation Project of Foshan [2016AG100193]
机构署名:
本校为其他机构
院系归属:
电气工程学院
摘要:
In order to improve the quality of peak characteristics extraction in chromatographic data, an automatic peak fitting method based on wavelet ridges and morphology (WMPF) was proposed. In handling overlapping peaks and weak peaks, WMPF gave solution to deal with the shortcomings of existing peak detection methods. The ridge line of the signal was obtained by wavelet transform of the original chromatogram signal, and the signal was divided into peak areas and non-peak areas. Then, we processed morphological operations with an adaptive window, and combined Gaussian fitting with wavelet ridge inf...

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