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Design of a pulsed eddy current testing power supply combining constant amplitude and clamp voltage control

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成果类型:
期刊论文
作者:
Chen, Wenguang;Wen, Shuang;Liu, Zhijian;Zheng, Liang
通讯作者:
Chen, WG
作者机构:
[Chen, Wenguang; Wen, Shuang; Liu, Zhijian; Zheng, Liang] Univ South China, Sch Elect Engn, Hengyang 421001, Peoples R China.
通讯机构:
[Chen, WG ] U
Univ South China, Sch Elect Engn, Hengyang 421001, Peoples R China.
语种:
英文
关键词:
Defects;Non-destructive testing;Pulsed eddy current testing;Pulsed power supply;Clamp circuits
期刊:
Analog Integrated Circuits and Signal Processing
ISSN:
0925-1030
年:
2025
卷:
122
期:
2
页码:
1-11
基金类别:
This research was funded by the National key research and development plan project, grant number 2018YFE0303103.
机构署名:
本校为第一且通讯机构
院系归属:
电气工程学院
摘要:
Pulsed Eddy Current Testing (PECT) is a hotspot for non-destructive testing of metallic materials. As a key part of the system, the performance of the excitation source will directly affect the results. A new pulse power supply circuit is proposed to overcome the problems of long turn-off time, no constant current control, large volume, and low power of the excitation source in the existing PECT method for material defects. It uses a combination of linear regulated power supply and switched power supply to realize a compound circuit topology of constant current and constant voltage clamp. Then...

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