期刊论文

Experimental Study on γ-ray Ionization Irradiation of CMOS Image Sensor

中文

机械工程师

1002-2333

2019

11

11-13

本校为第一机构

为了研究核退役装备在核辐射环境下作业时图像监控设备的工作状态等数据,对用在核退役作业现场的某国产CMOS图像传感器进行γ辐照实验。采集得到辐照时的γ射线对CMOS图像传感器所输出的暗图像造成的干扰数据,并研究γ射线对CMOS图像传感器的性能参数影响。实验结果表明:辐射射线的总剂量效应使得传感器中暗电流增大,传感器输出的图像里脉冲颗粒噪声与平均灰度值会随着辐照剂量的变化而发生变化。

In order to study the working status of image monitoring equipment during nuclear decommissioning equipment operation in nuclear radiation environment, a γ-ray irradiation experiment is carried out on a domestic CMOS image sensor used in the nuclear decommissioning operation site. The interference data caused by γ-ray on the dark image output by the CMOS image sensor during the irradiation is collected, and the influence of γ-ray on the performance parameters of the CMOS image sensor is studied. The experimental results show that the total d...