The adsorption mechanism of O-isopropyl-S-[2-(hydroxyimino) propyl] dithiocarbonate ester (IPXPO) to chalcopyrite was investigated by using contact angle, in-situ atomic force microscopy (in-situ AFM), cyclic voltammetry (CV) and X-ray photoelectron spectroscopy (XPS). The results of contact angle and in-situ AFM demonstrated that IPXPO adsorbed on chalcopyrite increases surface hydrophobicity and roughness. It was found by CV experiments that a layer passive film was formed. The results of XPS spectra further revealed that the thiol S atom, ox...