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Automatic and Intellectualized Reconstruction of The Surface Roughness Measuring Instrument

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成果类型:
期刊论文、会议论文
作者:
Yuan, Fengwei*;Jiang, Yan;Hu, Liangbin
通讯作者:
Yuan, Fengwei
作者机构:
[Jiang, Yan; Hu, Liangbin; Yuan, Fengwei] Univ S China, Coll Mech Engn, Hengyang 421001, Hunan, Peoples R China.
通讯机构:
[Yuan, Fengwei] U
Univ S China, Coll Mech Engn, Hengyang 421001, Hunan, Peoples R China.
语种:
英文
关键词:
Measuring Instrument;Surface Roughness;Intellectualized Reconstruction
期刊:
Advanced Materials Research
ISSN:
1022-6680
年:
2011
卷:
328-330
页码:
1912-1915
会议名称:
2011 International Conference on Mechatronics and Materials Processing(2011年机电一体化与材料加工国际会议 ICMMP)
会议论文集名称:
2011 International Conference on Mechatronics and Materials Processing(2011年机电一体化与材料加工国际会议 ICMMP)论文集
会议时间:
2011-11-18
会议地点:
广州
会议主办单位:
[Yuan, Fengwei;Jiang, Yan;Hu, Liangbin] Univ S China, Coll Mech Engn, Hengyang 421001, Hunan, Peoples R China.
会议赞助商:
广州大学
主编:
Zhang, LC Zhang, CL Chen, Z
出版地:
LAUBLSRUTISTR 24, CH-8717 STAFA-ZURICH, SWITZERLAND
出版者:
TRANS TECH PUBLICATIONS LTD
ISBN:
978-3-03785-238-5
机构署名:
本校为第一且通讯机构
院系归属:
机械工程学院
摘要:
The automatic and intellectualized reconstruction is the important way to improve and expand the traditional instrumental function. The surface roughness is an important indicator of effecting parts and products performance. On the basis of using precision measurement technology, electronic technology and computer technology synthetically, the principle and method of the automatic and intellectualized reconstruction of JB-3C Type Surface Roughness Measuring Instrument is mainly introduced, which is to reconstruct the hardware circuit and develop function in view of the flaws that the data proc...

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