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Influences of arc current on microstructure of Cr coating for Zr-4 alloy prepared by multi-arc ion plating via EBSD

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成果类型:
期刊论文
作者:
Huang, Jinghao;Zou, Shuliang;Xiao, Weiwei;Yang, Chen;Tang, Dewen;...
通讯作者:
Weiwei Xiao
作者机构:
[Huang, Jinghao; Zou, Shuliang] Univ South China, Sch Resource Environm & Safety Engn, Hengyang 421001, Hunan, Peoples R China.
[Yang, Chen; Huang, Jinghao; Zou, Shuliang; Xiao, Weiwei; Tang, Dewen] Univ South China, Hunan Prov Key Lab Emergency Safety Technol & Equ, Hengyang 421001, Hunan, Peoples R China.
[Yang, Chen; Xiao, Weiwei; Tang, Dewen] Univ South China, Sch Mech Engn, Hengyang 421001, Hunan, Peoples R China.
[Zhang, Kun; Yu, Hongxing; Zhang, Lin] Nucl Power Inst China, Chengdu 610213, Sichuan, Peoples R China.
通讯机构:
[Weiwei Xiao] H
Hunan Provincial Key Laboratory of Emergency Safety Technology and Equipment for Nuclear Facilities, University of South China, Hengyang, Hunan 421001, China<&wdkj&>School of Mechanical Engineering, University of South China, Hengyang, Hunan 421001, China
语种:
英文
关键词:
Cr coating;EBSD;Microstructure evolution;Arc current;Dynamic recrystallization
期刊:
Materials Characterization
ISSN:
1044-5803
年:
2021
卷:
178
页码:
111211
基金类别:
National Natural Science Foundation of China Joint Fund Key Support Project [U1867219]; Natural Science Foundation of Hunan Province of ChinaNatural Science Foundation of Hunan Province [2020JJ5467]; Scientific Research Foundation of Hunan Provincial Education DepartmentHunan Provincial Education Department [18A240, 19B492]
机构署名:
本校为第一机构
院系归属:
机械工程学院
摘要:
The present work is aimed to investigate the influences of arc current on the microstructure evolution of the as-deposited Cr coatings for accident tolerant fuel. Cr coatings were prepared on the surface of Zr-4 alloy by multi-arc ion plating with different arc currents. Electron backscattering diffraction (EBSD) technology was employed to characterize the microstructure evolution of the as-deposited Cr coatings, including the distribution of grain boundaries, the mean grain size, the crystallographic orientation distribution, the dislocation d...

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