The propagation of single-event effects (SEEs) on a Xilinx Zynq-7000 system on chip (SoC) was investigated using heavy-ion microbeam radiation. The irradiation results reveal several functional blocks’ sensitivity locations and cross sections, for instance, the arithmetic logic unit, register, D-cache, and peripheral, while irradiating the on-chip memory (OCM) region. Moreover, event tree analysis was executed based on the obtained microbeam irradiation results. This study quantitatively assesses the probabilities o...
