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The measurement of low-level 220Rn by software delayed coincidence method

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成果类型:
期刊论文、会议论文
作者:
Yan, Yongjun;Lai, Wei;Zhou, Jianliang
通讯作者:
Yan, Y.(yan_jason@163.com)
作者机构:
[Zhou, Jianliang; Yan, Yongjun; Lai, Wei] School of Nuclear Science and Technology, University of South China, Hengyang, China
通讯机构:
[Yan, Y.] S
School of Nuclear Science and Technology, , Hengyang, China
语种:
英文
关键词:
comparative experiments;software delayed coincidence
期刊:
Advances in Intelligent Systems and Computing
ISSN:
2194-5357
年:
2013
卷:
180 AISC
页码:
407-413
会议名称:
2012 International Conference of Intelligence Computation and Evolutionary Computation, ICEC 2012
会议时间:
7 July 2012 through 7 July 2012
出版者:
Springer Verlag
ISBN:
9783642316555
机构署名:
本校为第一机构
院系归属:
核科学技术学院
摘要:
This paper introduces a new software delayed coincidence counting technology,which requires less storage space. An experiment system was established for measurement of lowlevel220Rn. The methods were validated experimentally by intercomparison measurements. The results show that220Rn of decay rate of between 3dpm~20dpm can be measured by the experiment system with error of ±2%, when the background count rate is of 2dpm~4dpm. &cop...

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